Adaptive Speckle Imaging Interferometry: a new technique for the analysis of microstructure dynamics, drying processes and coating formation

摘要

We describe an extension of multi-speckle diffusing wave spectroscopy adaptedto follow the non-stationary microscopic dynamics in drying films and coatingsin a very reactive way and with a high dynamic range. We call this technique"Adaptive Speckle Imaging Interferometry". We introduce an efficient tool, theinter-image distance, to evaluate the speckle dynamics, and the concept of"speckle rate" (SR, in Hz) to quantify this dynamics. The adaptive algorithmplots a simple kinetics, the time evolution of the SR, providing a non-invasivecharacterization of drying phenomena. A new commercial instrument, calledHORUS(R), based on ASII and specialized in the analysis of film formation anddrying processes is presented.